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韓國Nano-View
韓國NanoView公司在橢偏儀領(lǐng)域不斷創(chuàng)新，擁有多項專利技術(shù)。多年來一直致力于高性能橢偏儀的研制與生產(chǎn)，其產(chǎn)品主要用于半導體、導體、介質(zhì)和液體薄膜的厚度、光學特性、成分比例和表面粗糙度等測量和分析，也可用于半導體器件和FPD顯示等領(lǐng)域。目前主要產(chǎn)品分光橢偏儀，以獨特的設(shè)計和無需校準等多項先進專利技術(shù)，使得測試時間大大減少的同時極大地增加了測量精度。
最新開發(fā)的多傳感頭的分光橢偏儀，用于半導體和顯示器生產(chǎn)線的在線Mapping分析。
Nano-View is developing and producing the state of the art equipments that can measure and analyze the thickness, optical properties, composition ratio and the surface roughness of the semiconductor, conductor, dielectric and liquid thin films that are used in semiconductor devices, LCD display and solar cell.
Our current main products are the spectroscopic ellipsometers that can greatly reduce the measurement time and increase the accuracy as a result of our patented 'calibration and alignment free' method. High speed measurement is also possible by using a multichannel detector. We also reduced the size of the equipment greatly so that the foot print is minimal. The measurement and the analysis can be very easily done by simple and user-friendly software.
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